William F. Guthrie received a B.A. degree in mathematics from Case Western Reserve University, Cleveland, OH, in 1987 and an M.S. degree in statistics from The Ohio State University, Columbus, OH, in 1990. He joined the Statistical Engineering Division at the National Institute of Standards and Technology (NIST), Gaithersburg, MD in 1989.

He has collaborated with NIST scientists and engineers in a wide range of areas, applying statistical methods to solve problems in semiconductor and microelectronic metrology, building materials research, and chemical science. His statistical interests include uncertainty assessment, Bayesian statistics, design of experiments, calibration, modern regression methods, and statistical computation.